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Sequential Path Entanglement for Quantum Metrology

Path entanglement is a key resource for quantum metrology. Using path-entangled states, the standard quantum limit can be beaten, and the Heisenberg limit can be achieved. However, the preparation and detection of such states scales unfavourably with the number of photons. Here we introduce sequenti...

Deskribapen osoa

Gorde:
Xehetasun bibliografikoak
Egile Nagusiak: Jin, Xian-Min, Peng, Cheng-Zhi, Deng, Youjin, Barbieri, Marco, Nunn, Joshua, Walmsley, Ian A.
Formatua: Artigo
Hizkuntza:Inglês
Argitaratua: Nature Publishing Group 2013
Gaiak:
Sarrera elektronikoa:https://ncbi.nlm.nih.gov/pmc/articles/PMC3646273/
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/srep01779
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