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Modulation in current density of metal/n-SiC contact by inserting Al(2)O(3) interfacial layer

Metal contact to SiC is not easy to modulate since the contact can be influenced by the metal, the termination of the SiC, the doping, and the fabrication process. In this work, we introduce a method by inserting a thin Al(2)O(3) layer between metal and SiC to solve this problem simply but effective...

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Detalhes bibliográficos
Main Authors: Zheng, Shan, Sun, Qing-Qing, Yang, Wen, Zhou, Peng, Lu, Hong-Liang, Zhang, David Wei
Formato: Artigo
Idioma:Inglês
Publicado em: Springer 2013
Assuntos:
Acesso em linha:https://ncbi.nlm.nih.gov/pmc/articles/PMC3614437/
https://ncbi.nlm.nih.gov/pubmed/23452618
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1186/1556-276X-8-116
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