Interferometric hard x-ray phase contrast imaging at 204 nm grating period

We report on hard x-ray phase contrast imaging experiments using a grating interferometer of approximately 1/10th the grating period achieved in previous studies. We designed the gratings as a staircase array of multilayer stacks which are fabricated in a single thin film deposition process. We perf...

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Bibliographic Details
Main Authors: Wen, Han, Wolfe, Douglas E., Gomella, Andrew A., Miao, Houxun, Xiao, Xianghui, Liu, Chian, Lynch, Susanna K., Morgan, Nicole
Format: Artigo
Language:Inglês
Published: American Institute of Physics 2013
Subjects:
Microscopy and Imaging
Online Access:https://ncbi.nlm.nih.gov/pmc/articles/PMC3574100/
https://ncbi.nlm.nih.gov/pubmed/23387658
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1063/1.4788910
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