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Nanoscale evidence of erbium clustering in Er-doped silicon-rich silica
Photoluminescence spectroscopy and atom probe tomography were used to explore the optical activity and microstructure of Er(3+)-doped Si-rich SiO(2) thin films fabricated by radio-frequency magnetron sputtering. The effect of post-fabrication annealing treatment on the properties of the films was in...
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| Hlavní autoři: | , , , , , |
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| Médium: | Artigo |
| Jazyk: | Inglês |
| Vydáno: |
Springer
2013
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| Témata: | |
| On-line přístup: | https://ncbi.nlm.nih.gov/pmc/articles/PMC3564724/ https://ncbi.nlm.nih.gov/pubmed/23336324 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1186/1556-276X-8-39 |
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