Nanoscale evidence of erbium clustering in Er-doped silicon-rich silica

Photoluminescence spectroscopy and atom probe tomography were used to explore the optical activity and microstructure of Er(3+)-doped Si-rich SiO(2) thin films fabricated by radio-frequency magnetron sputtering. The effect of post-fabrication annealing treatment on the properties of the films was in...

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Bibliografiske detaljer
Main Authors: Talbot, Etienne, Lardé, Rodrigue, Pareige, Philippe, Khomenkova, Larysa, Hijazi, Khalil, Gourbilleau, Fabrice
Format: Artigo
Sprog:Inglês
Udgivet: Springer 2013
Fag:
Nano Express
Online adgang:https://ncbi.nlm.nih.gov/pmc/articles/PMC3564724/
https://ncbi.nlm.nih.gov/pubmed/23336324
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1186/1556-276X-8-39
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