Cargando...
Nanoscale evidence of erbium clustering in Er-doped silicon-rich silica
Photoluminescence spectroscopy and atom probe tomography were used to explore the optical activity and microstructure of Er(3+)-doped Si-rich SiO(2) thin films fabricated by radio-frequency magnetron sputtering. The effect of post-fabrication annealing treatment on the properties of the films was in...
Guardado en:
| Autores principales: | , , , , , |
|---|---|
| Formato: | Artigo |
| Lenguaje: | Inglês |
| Publicado: |
Springer
2013
|
| Materias: | |
| Acceso en línea: | https://ncbi.nlm.nih.gov/pmc/articles/PMC3564724/ https://ncbi.nlm.nih.gov/pubmed/23336324 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1186/1556-276X-8-39 |
| Etiquetas: |
Agregar Etiqueta
Sin Etiquetas, Sea el primero en etiquetar este registro!
|