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Nanoscale evidence of erbium clustering in Er-doped silicon-rich silica
Photoluminescence spectroscopy and atom probe tomography were used to explore the optical activity and microstructure of Er(3+)-doped Si-rich SiO(2) thin films fabricated by radio-frequency magnetron sputtering. The effect of post-fabrication annealing treatment on the properties of the films was in...
Gorde:
| Egile Nagusiak: | , , , , , |
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| Formatua: | Artigo |
| Hizkuntza: | Inglês |
| Argitaratua: |
Springer
2013
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| Gaiak: | |
| Sarrera elektronikoa: | https://ncbi.nlm.nih.gov/pmc/articles/PMC3564724/ https://ncbi.nlm.nih.gov/pubmed/23336324 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1186/1556-276X-8-39 |
| Etiketak: |
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