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Reversible mechano-electrochemical writing of metallic nanostructures with the tip of an atomic force microscope

We recently introduced a method that allows the controlled deposition of nanoscale metallic patterns at defined locations using the tip of an atomic force microscope (AFM) as a “mechano-electrochemical pen”, locally activating a passivated substrate surface for site-selective electrochemical deposit...

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Detalhes bibliográficos
Main Authors: Obermair, Christian, Kress, Marina, Wagner, Andreas, Schimmel, Thomas
Formato: Artigo
Idioma:Inglês
Publicado em: Beilstein-Institut 2012
Assuntos:
Acesso em linha:https://ncbi.nlm.nih.gov/pmc/articles/PMC3557521/
https://ncbi.nlm.nih.gov/pubmed/23365795
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3762/bjnano.3.92
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