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Non-rigid image registration to reduce beam-induced blurring of cryo-electron microscopy images
The typical dose used to record cryo-electron microscopy images from vitrified biological specimens is so high that radiation-induced structural alterations are bound to occur during data acquisition. Integration of all scattered electrons into one image can lead to significant blurring, particularl...
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| Main Authors: | , , , , |
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| Format: | Artigo |
| Sprog: | Inglês |
| Udgivet: |
International Union of Crystallography
2013
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| Fag: | |
| Online adgang: | https://ncbi.nlm.nih.gov/pmc/articles/PMC3526921/ https://ncbi.nlm.nih.gov/pubmed/23254656 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1107/S0909049512044408 |
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