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Junction investigation of graphene/silicon Schottky diodes

Here we present a facile technique for the large-scale production of few-layer graphene flakes. The as-sonicated, supernatant, and sediment of the graphene product were respectively sprayed onto different types of silicon wafers. It was found that all devices exhibited current rectification properti...

Täydet tiedot

Tallennettuna:
Bibliografiset tiedot
Päätekijät: Mohammed, Muatez, Li, Zhongrui, Cui, Jingbiao, Chen, Tar-pin
Aineistotyyppi: Artigo
Kieli:Inglês
Julkaistu: Springer 2012
Aiheet:
Linkit:https://ncbi.nlm.nih.gov/pmc/articles/PMC3512491/
https://ncbi.nlm.nih.gov/pubmed/22687246
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1186/1556-276X-7-302
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