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X-ray absorption near edge spectroscopy with a superconducting detector for nitrogen dopants in SiC
Fluorescence-yield X-ray absorption fine structure (FY-XAFS) is extensively used for investigating atomic-scale local structures around specific elements in functional materials. However, conventional FY-XAFS instruments frequently cannot cover trace light elements, for example dopants in wide gap s...
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| Main Authors: | , , , , , |
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| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado em: |
Nature Publishing Group
2012
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| Assuntos: | |
| Acesso em linha: | https://ncbi.nlm.nih.gov/pmc/articles/PMC3496949/ https://ncbi.nlm.nih.gov/pubmed/23152937 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/srep00831 |
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