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A hybrid scanning mode for fast scanning ion conductance microscopy (SICM) imaging
We have developed a new method of controlling the pipette for scanning ion conductance microscopy to obtain high-resolution images faster. The method keeps the pipette close to the surface during a single line scan but does not follow the exact surface topography, which is calculated by using the io...
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| 主要な著者: | , , , , |
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| フォーマット: | Artigo |
| 言語: | Inglês |
| 出版事項: |
Elsevier
2012
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| 主題: | |
| オンライン･アクセス: | https://ncbi.nlm.nih.gov/pmc/articles/PMC3462995/ https://ncbi.nlm.nih.gov/pubmed/22902298 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1016/j.ultramic.2012.06.015 |
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