Zhukov, A., Richards, O., Ostanin, V., Korchev, Y., & Klenerman, D. (2012). A hybrid scanning mode for fast scanning ion conductance microscopy (SICM) imaging. Elsevier.
Παραπομπή Chicago StyleZhukov, Alex, Owen Richards, Victor Ostanin, Yuri Korchev, και David Klenerman. A Hybrid Scanning Mode for Fast Scanning Ion Conductance Microscopy (SICM) Imaging. Elsevier, 2012.
Παραπομπή MLAZhukov, Alex, et al. A Hybrid Scanning Mode for Fast Scanning Ion Conductance Microscopy (SICM) Imaging. Elsevier, 2012.
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