Zhukov, A., Richards, O., Ostanin, V., Korchev, Y., & Klenerman, D. (2012). A hybrid scanning mode for fast scanning ion conductance microscopy (SICM) imaging. Elsevier.
Citação norma ChicagoZhukov, Alex, Owen Richards, Victor Ostanin, Yuri Korchev, and David Klenerman. A Hybrid Scanning Mode for Fast Scanning Ion Conductance Microscopy (SICM) Imaging. Elsevier, 2012.
Citação norma MLAZhukov, Alex, et al. A Hybrid Scanning Mode for Fast Scanning Ion Conductance Microscopy (SICM) Imaging. Elsevier, 2012.
Nota: a formatação da citação pode não corresponder 100% ao definido pela respectiva norma.