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Early stages of growth of gold layers sputter deposited on glass and silicon substrates

Extremely thin gold layers were sputter deposited on glass and silicon substrates, and their thickness and morphology were studied by Rutherford backscattering (RBS) and atomic force microscopy (AFM) methods. The deposited layers change from discontinuous to continuous ones for longer deposition tim...

पूर्ण विवरण

में बचाया:
ग्रंथसूची विवरण
मुख्य लेखकों: Malinský, Petr, Slepička, Petr, Hnatowicz, Vladimír, Švorčík, Václav
स्वरूप: Artigo
भाषा:Inglês
प्रकाशित: Springer 2012
विषय:
ऑनलाइन पहुंच:https://ncbi.nlm.nih.gov/pmc/articles/PMC3405445/
https://ncbi.nlm.nih.gov/pubmed/22559151
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1186/1556-276X-7-241
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