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Attributional Style among Youth at Clinical Risk for Psychosis

AIM: A biased attributional style, in which negative events are attributed to external and personal causes, is associated with paranoid delusions in schizophrenia. It is not known whether this biased attributional style also characterizes individuals at clinical risk for psychosis, or if it is assoc...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: DeVylder, Jordan E., Ben-David, Shelly, Kimhy, David, Corcoran, Cheryl M.
Format: Artigo
Sprache:Inglês
Veröffentlicht: 2012
Schlagworte:
Online Zugang:https://ncbi.nlm.nih.gov/pmc/articles/PMC3371290/
https://ncbi.nlm.nih.gov/pubmed/22390315
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1111/j.1751-7893.2012.00347.x
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