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Attributional Style among Youth at Clinical Risk for Psychosis

AIM: A biased attributional style, in which negative events are attributed to external and personal causes, is associated with paranoid delusions in schizophrenia. It is not known whether this biased attributional style also characterizes individuals at clinical risk for psychosis, or if it is assoc...

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Bibliografski detalji
Glavni autori: DeVylder, Jordan E., Ben-David, Shelly, Kimhy, David, Corcoran, Cheryl M.
Format: Artigo
Jezik:Inglês
Izdano: 2012
Teme:
Online pristup:https://ncbi.nlm.nih.gov/pmc/articles/PMC3371290/
https://ncbi.nlm.nih.gov/pubmed/22390315
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1111/j.1751-7893.2012.00347.x
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