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Characterization of Thick and Thin Film SiCN for Pressure Sensing at High Temperatures

Pressure measurement in high temperature environments is important in many applications to provide valuable information for performance studies. Information on pressure patterns is highly desirable for improving performance, condition monitoring and accurate prediction of the remaining life of syste...

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Autors principals: Leo, Alfin, Andronenko, Sergey, Stiharu, Ion, Bhat, Rama B.
Format: Artigo
Idioma:Inglês
Publicat: Molecular Diversity Preservation International (MDPI) 2010
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Accés en línia:https://ncbi.nlm.nih.gov/pmc/articles/PMC3244017/
https://ncbi.nlm.nih.gov/pubmed/22205871
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3390/s100201338
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