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Accurate Permittivity Measurements for Microwave Imaging via Ultra-Wideband Removal of Spurious Reflectors
The use of microwave imaging is becoming more prevalent for detection of interior hidden defects in manufactured and packaged materials. In applications for detection of hidden moisture, microwave tomography can be used to image the material and then perform an inverse calculation to derive an estim...
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| 主要な著者: | , , , |
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| フォーマット: | Artigo |
| 言語: | Inglês |
| 出版事項: |
Molecular Diversity Preservation International (MDPI)
2010
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| 主題: | |
| オンライン･アクセス: | https://ncbi.nlm.nih.gov/pmc/articles/PMC3231232/ https://ncbi.nlm.nih.gov/pubmed/22163668 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3390/s100908491 |
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