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Accurate Permittivity Measurements for Microwave Imaging via Ultra-Wideband Removal of Spurious Reflectors

The use of microwave imaging is becoming more prevalent for detection of interior hidden defects in manufactured and packaged materials. In applications for detection of hidden moisture, microwave tomography can be used to image the material and then perform an inverse calculation to derive an estim...

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Detalhes bibliográficos
Main Authors: Pelletier, Mathew G., Viera, Joseph A., Wanjura, John, Holt, Greg
Formato: Artigo
Idioma:Inglês
Publicado em: Molecular Diversity Preservation International (MDPI) 2010
Assuntos:
Acesso em linha:https://ncbi.nlm.nih.gov/pmc/articles/PMC3231232/
https://ncbi.nlm.nih.gov/pubmed/22163668
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3390/s100908491
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