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Thickness-dependent optimization of Er(3+ )light emission from silicon-rich silicon oxide thin films
This study investigates the influence of the film thickness on the silicon-excess-mediated sensitization of Erbium ions in Si-rich silica. The Er(3+ )photoluminescence at 1.5 μm, normalized to the film thickness, was found five times larger for films 1 μm-thick than that from 50-nm-thick films inten...
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| Main Authors: | , , , , , |
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| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado: |
Springer
2011
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| Assuntos: | |
| Acceso en liña: | https://ncbi.nlm.nih.gov/pmc/articles/PMC3211489/ https://ncbi.nlm.nih.gov/pubmed/21711930 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1186/1556-276X-6-395 |
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