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Force scanning: A rapid, high-resolution approach for spatial mechanical property mapping

Atomic force microscopy (AFM) can be used to co-localize mechanical properties and topographical features through property mapping techniques. The most common approach for testing biological materials at the micro-and nano-scales is force mapping, which involves taking individual force curves at dis...

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Detalhes bibliográficos
Autor principal: Darling, E M
Formato: Artigo
Idioma:Inglês
Publicado em: 2011
Assuntos:
Acesso em linha:https://ncbi.nlm.nih.gov/pmc/articles/PMC3150532/
https://ncbi.nlm.nih.gov/pubmed/21411911
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1088/0957-4484/22/17/175707
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