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Deconstructing the Late Phase of Vimentin Assembly by Total Internal Reflection Fluorescence Microscopy (TIRFM)

Quantitative imaging of intermediate filaments (IF) during the advanced phase of the assembly process is technically difficult, since the structures are several µm long and therefore they exceed the field of view of many electron (EM) or atomic force microscopy (AFM) techniques. Thereby quantitative...

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Detalhes bibliográficos
Main Authors: Winheim, Stefan, Hieb, Aaron R., Silbermann, Marleen, Surmann, Eva-Maria, Wedig, Tatjana, Herrmann, Harald, Langowski, Jörg, Mücke, Norbert
Formato: Artigo
Idioma:Inglês
Publicado em: Public Library of Science 2011
Assuntos:
Acesso em linha:https://ncbi.nlm.nih.gov/pmc/articles/PMC3081349/
https://ncbi.nlm.nih.gov/pubmed/21544245
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1371/journal.pone.0019202
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