Deconstructing the Late Phase of Vimentin Assembly by Total Internal Reflection Fluorescence Microscopy (TIRFM)

Quantitative imaging of intermediate filaments (IF) during the advanced phase of the assembly process is technically difficult, since the structures are several µm long and therefore they exceed the field of view of many electron (EM) or atomic force microscopy (AFM) techniques. Thereby quantitative...

Täydet tiedot

Tallennettuna:
Bibliografiset tiedot
Päätekijät: Winheim, Stefan, Hieb, Aaron R., Silbermann, Marleen, Surmann, Eva-Maria, Wedig, Tatjana, Herrmann, Harald, Langowski, Jörg, Mücke, Norbert
Aineistotyyppi: Artigo
Kieli:Inglês
Julkaistu: Public Library of Science 2011
Aiheet:
Research Article
Linkit:https://ncbi.nlm.nih.gov/pmc/articles/PMC3081349/
https://ncbi.nlm.nih.gov/pubmed/21544245
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1371/journal.pone.0019202
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