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Defects in oxide surfaces studied by atomic force and scanning tunneling microscopy
Surfaces of thin oxide films were investigated by means of a dual mode NC-AFM/STM. Apart from imaging the surface termination by NC-AFM with atomic resolution, point defects in magnesium oxide on Ag(001) and line defects in aluminum oxide on NiAl(110), respectively, were thoroughly studied. The conta...
में बचाया:
| मुख्य लेखकों: | , , , , |
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| स्वरूप: | Artigo |
| भाषा: | Inglês |
| प्रकाशित: |
Beilstein-Institut
2011
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| विषय: | |
| ऑनलाइन पहुंच: | https://ncbi.nlm.nih.gov/pmc/articles/PMC3045939/ https://ncbi.nlm.nih.gov/pubmed/21977410 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3762/bjnano.2.1 |
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