Defects in oxide surfaces studied by atomic force and scanning tunneling microscopy

Surfaces of thin oxide films were investigated by means of a dual mode NC-AFM/STM. Apart from imaging the surface termination by NC-AFM with atomic resolution, point defects in magnesium oxide on Ag(001) and line defects in aluminum oxide on NiAl(110), respectively, were thoroughly studied. The conta...

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Bibliografski detalji
Glavni autori: König, Thomas, Simon, Georg H, Heinke, Lars, Lichtenstein, Leonid, Heyde, Markus
Format: Artigo
Jezik:Inglês
Izdano: Beilstein-Institut 2011
Teme:
Review
Online pristup:https://ncbi.nlm.nih.gov/pmc/articles/PMC3045939/
https://ncbi.nlm.nih.gov/pubmed/21977410
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3762/bjnano.2.1
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