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Temperature dependence of 1∕f noise mechanisms in silicon nanowire biochemical field effect transistors

The 1∕f noise of silicon nanowire biochemical field effect transistors is fully characterized from weak to strong inversion in the temperature range 100–300 K. At 300 K, our devices follow the correlated Δn-Δμ model. As the temperature is lowered, the correlated mobility fluctuations become insignif...

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Detalles Bibliográficos
Main Authors: Rajan, Nitin K., Routenberg, David A., Chen, Jin, Reed, Mark A.
Formato: Artigo
Idioma:Inglês
Publicado: American Institute of Physics 2010
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Acceso en liña:https://ncbi.nlm.nih.gov/pmc/articles/PMC3017570/
https://ncbi.nlm.nih.gov/pubmed/21221250
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1063/1.3526382
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