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Atomic Force Microscopy Study of the Kinetic Roughening in Nanostructured Gold Films on SiO(2)

Dynamic scaling behavior has been observed during the room-temperature growth of sputtered Au films on SiO(2)using the atomic force microscopy technique. By the analyses of the dependence of the roughness, σ, of the surface roughness power,P(f), and of the correlation length,ξ, on the film thickness...

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Wedi'i Gadw mewn:
Manylion Llyfryddiaeth
Prif Awduron: Ruffino, F, Grimaldi, MG, Giannazzo, F, Roccaforte, F, Raineri, V
Fformat: Artigo
Iaith:Inglês
Cyhoeddwyd: Springer 2009
Pynciau:
Mynediad Ar-lein:https://ncbi.nlm.nih.gov/pmc/articles/PMC2894129/
https://ncbi.nlm.nih.gov/pubmed/20596386
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1007/s11671-008-9235-0
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