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High-resolution x-ray diffraction microscopy of specifically labeled yeast cells
X-ray diffraction microscopy complements other x-ray microscopy methods by being free of lens-imposed radiation dose and resolution limits, and it allows for high-resolution imaging of biological specimens too thick to be viewed by electron microscopy. We report here the highest resolution (11–13 nm...
Gorde:
| Egile Nagusiak: | , , , , , , , , |
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| Formatua: | Artigo |
| Hizkuntza: | Inglês |
| Argitaratua: |
National Academy of Sciences
2010
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| Gaiak: | |
| Sarrera elektronikoa: | https://ncbi.nlm.nih.gov/pmc/articles/PMC2867732/ https://ncbi.nlm.nih.gov/pubmed/20368463 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1073/pnas.0910874107 |
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