High-resolution x-ray diffraction microscopy of specifically labeled yeast cells

X-ray diffraction microscopy complements other x-ray microscopy methods by being free of lens-imposed radiation dose and resolution limits, and it allows for high-resolution imaging of biological specimens too thick to be viewed by electron microscopy. We report here the highest resolution (11–13 nm...

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Bibliographic Details
Main Authors: Nelson, Johanna, Huang, Xiaojing, Steinbrener, Jan, Shapiro, David, Kirz, Janos, Marchesini, Stefano, Neiman, Aaron M., Turner, Joshua J., Jacobsen, Chris
Format: Artigo
Language:Inglês
Published: National Academy of Sciences 2010
Subjects:
Physical Sciences
Online Access:https://ncbi.nlm.nih.gov/pmc/articles/PMC2867732/
https://ncbi.nlm.nih.gov/pubmed/20368463
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1073/pnas.0910874107
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