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Robust Pattern Transfer of Nanoimprinted Features for Sub-5 nm Fabrication

We explore the limits of a simple and facile process for transferring low aspect ratio, high resolution features defined by nanoimprint lithography. The process involves post-imprint deposition of an angle-evaporated hard mask. This widens the process window for residual resist removal and facilitat...

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Detalhes bibliográficos
Main Authors: Schvartzman, Mark, Wind, Shalom J.
Formato: Artigo
Idioma:Inglês
Publicado em: 2009
Assuntos:
Acesso em linha:https://ncbi.nlm.nih.gov/pmc/articles/PMC2761997/
https://ncbi.nlm.nih.gov/pubmed/19722536
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1021/nl9018512
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