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The effect of incident angle on the C(60)(+) bombardment of molecular solids
The effect of incident angle on the quality of SIMS molecular depth profiling using C(60)(+) was investigated. Cholesterol films of ~300 nm thickness on Si were employed as a model and were eroded using 40 keV C(60)(+) at an incident angle of 40° and 73° with respect to the surface normal. The erosi...
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| Hauptverfasser: | , , |
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| Format: | Artigo |
| Sprache: | Inglês |
| Veröffentlicht: |
2008
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| Schlagworte: | |
| Online Zugang: | https://ncbi.nlm.nih.gov/pmc/articles/PMC2700760/ https://ncbi.nlm.nih.gov/pubmed/19554201 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1016/j.apsusc.2008.05.254 |
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