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The effect of incident angle on the C(60)(+) bombardment of molecular solids

The effect of incident angle on the quality of SIMS molecular depth profiling using C(60)(+) was investigated. Cholesterol films of ~300 nm thickness on Si were employed as a model and were eroded using 40 keV C(60)(+) at an incident angle of 40° and 73° with respect to the surface normal. The erosi...

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Detaylı Bibliyografya
Asıl Yazarlar: Kozole, Joseph, Willingham, David, Winograd, Nicholas
Materyal Türü: Artigo
Dil:Inglês
Baskı/Yayın Bilgisi: 2008
Konular:
Online Erişim:https://ncbi.nlm.nih.gov/pmc/articles/PMC2700760/
https://ncbi.nlm.nih.gov/pubmed/19554201
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1016/j.apsusc.2008.05.254
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