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Dielectric fluctuations in force microscopy: Noncontact friction and frequency jitter
Electric force microscopy, in which a charged probe oscillates tens to hundreds of nanometers above a sample surface, provides direct mechanical detection of relaxation in molecular materials. Noncontact friction, the damping of the probe’s motions, reflects the dielectric function at the resonant f...
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| Hauptverfasser: | , , |
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| Format: | Artigo |
| Sprache: | Inglês |
| Veröffentlicht: |
American Institute of Physics
2008
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| Schlagworte: | |
| Online Zugang: | https://ncbi.nlm.nih.gov/pmc/articles/PMC2674627/ https://ncbi.nlm.nih.gov/pubmed/18554042 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1063/1.2932254 |
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