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Noncontact Dielectric Friction
Dielectric fluctuations are shown to be the dominant source of noncontact friction in high-sensitivity scanning probe microscopy of dielectric materials. Recent measurements have directly determined the friction acting on custom-fabricated single-crystal silicon cantilevers whose capacitively charge...
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| Glavni autori: | , , |
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| Format: | Artigo |
| Jezik: | Inglês |
| Izdano: |
2006
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| Teme: | |
| Online pristup: | https://ncbi.nlm.nih.gov/pmc/articles/PMC2323026/ https://ncbi.nlm.nih.gov/pubmed/16869550 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1021/jp061865n |
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