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Particle verification for single-particle, reference-based reconstruction using multivariate data analysis and classification

As collection of electron microscopy data for single-particle reconstruction becomes more efficient, due to electronic image capture, one of the principal limiting steps in a reconstruction remains particle verification, which is especially costly in terms of user input. Recently, some algorithms ha...

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Hlavní autoři: Shaikh, Tanvir R., Trujillo, Ramon, LeBarron, Jamie S., Baxter, William T., Frank, Joachim
Médium: Artigo
Jazyk:Inglês
Vydáno: 2008
Témata:
On-line přístup:https://ncbi.nlm.nih.gov/pmc/articles/PMC2577219/
https://ncbi.nlm.nih.gov/pubmed/18619547
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1016/j.jsb.2008.06.006
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