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MEASUREMENT OF THICKNESS WITHIN SECTIONS BY QUANTITATIVE ELECTRON MICROSCOPY

To apply the method of quantitative electron microscopy to the measurement of mass in thin sections, the thickness of the section at or very near the structure to be studied must be known. Dowex anion exchange resin AG 1 x 2, stained with phosphotungstic acid (PTA) at pH 6.4, was used as a thickness...

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書誌詳細
主要な著者: Silverman, Lloyd, Schreiner, Berit, Glick, David
フォーマット: Artigo
言語:Inglês
出版事項: The Rockefeller University Press 1969
主題:
オンライン・アクセス:https://ncbi.nlm.nih.gov/pmc/articles/PMC2107635/
https://ncbi.nlm.nih.gov/pubmed/4885478
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