Silverman, L., Schreiner, B., & Glick, D. (1969). MEASUREMENT OF THICKNESS WITHIN SECTIONS BY QUANTITATIVE ELECTRON MICROSCOPY. The Rockefeller University Press.
Citação norma ChicagoSilverman, Lloyd, Berit Schreiner, and David Glick. MEASUREMENT OF THICKNESS WITHIN SECTIONS BY QUANTITATIVE ELECTRON MICROSCOPY. The Rockefeller University Press, 1969.
Citação norma MLASilverman, Lloyd, Berit Schreiner, and David Glick. MEASUREMENT OF THICKNESS WITHIN SECTIONS BY QUANTITATIVE ELECTRON MICROSCOPY. The Rockefeller University Press, 1969.
Nota: a formatação da citação pode não corresponder 100% ao definido pela respectiva norma.