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Influence of polarized bias and porous silicon morphology on the electrical behavior of Au-porous silicon contacts

This paper reports the surface morphology and I-V curves of porous silicon (PS) samples and related devices. The observed fabrics on the PS surface were found to affect the electrical property of PS devices. When the devices were operated under different external bias (10 V or 3 V) for 10 min, their...

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Detalhes bibliográficos
Main Authors: Zhao, Yue, Li, Dong-sheng, Xing, Shou-xiang, Yang, De-ren, Jiang, Min-hua
Formato: Artigo
Idioma:Inglês
Publicado em: Zhejiang University Press 2005
Assuntos:
Acesso em linha:https://ncbi.nlm.nih.gov/pmc/articles/PMC1390663/
https://ncbi.nlm.nih.gov/pubmed/16252350
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1631/jzus.2005.B1135
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