Differentiation of Spores of Bacillus subtilis Grown in Different Media by Elemental Characterization Using Time-of-Flight Secondary Ion Mass Spectrometry

We demonstrate the use of time-of-flight secondary ion mass spectrometry (TOF-SIMS) in a forensics application to distinguish Bacillus subtilis spores grown in various media based on the elemental signatures of the spores. Triplicate cultures grown in each of four different media were analyzed to ob...

Ful tanımlama

Kaydedildi:
Detaylı Bibliyografya
Asıl Yazarlar: Cliff, John B., Jarman, Kristin H., Valentine, Nancy B., Golledge, Steven L., Gaspar, Daniel J., Wunschel, David S., Wahl, Karen L.
Materyal Türü: Artigo
Dil:Inglês
Baskı/Yayın Bilgisi: American Society for Microbiology 2005
Konular:
Methods
Online Erişim:https://ncbi.nlm.nih.gov/pmc/articles/PMC1287663/
https://ncbi.nlm.nih.gov/pubmed/16269677
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1128/AEM.71.11.6524-6530.2005
Etiketler: Etiketle
Etiket eklenmemiş, İlk siz ekleyin!

Benzer Materyaller