Differentiation of Spores of Bacillus subtilis Grown in Different Media by Elemental Characterization Using Time-of-Flight Secondary Ion Mass Spectrometry

We demonstrate the use of time-of-flight secondary ion mass spectrometry (TOF-SIMS) in a forensics application to distinguish Bacillus subtilis spores grown in various media based on the elemental signatures of the spores. Triplicate cultures grown in each of four different media were analyzed to ob...

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Detalhes bibliográficos
Main Authors: Cliff, John B., Jarman, Kristin H., Valentine, Nancy B., Golledge, Steven L., Gaspar, Daniel J., Wunschel, David S., Wahl, Karen L.
Formato: Artigo
Idioma:Inglês
Publicado em: American Society for Microbiology 2005
Assuntos:
Methods
Acesso em linha:https://ncbi.nlm.nih.gov/pmc/articles/PMC1287663/
https://ncbi.nlm.nih.gov/pubmed/16269677
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1128/AEM.71.11.6524-6530.2005
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