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An electromechanical material testing system for in situ electron microscopy and applications

We report the development of a material testing system for in situ electron microscopy (EM) mechanical testing of nanostructures. The testing system consists of an actuator and a load sensor fabricated by means of surface micromachining. This previously undescribed nanoscale material testing system...

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Detalhes bibliográficos
Main Authors: Zhu, Yong, Espinosa, Horacio D.
Formato: Artigo
Idioma:Inglês
Publicado em: National Academy of Sciences 2005
Assuntos:
Acesso em linha:https://ncbi.nlm.nih.gov/pmc/articles/PMC1253576/
https://ncbi.nlm.nih.gov/pubmed/16195381
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1073/pnas.0506544102
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