Nalaganje...
Bias Temperature Instability of MOSFETs: Physical Processes, Models, and Prediction
CMOS technology dominates the semiconductor industry, and the reliability of MOSFETs is a key issue. To optimize chip design, trade-offs between reliability, speed, power consumption, and cost must be carried out. This requires modeling and prediction of device instability, and a major source of ins...
Shranjeno v:
| Main Authors: | , , , , , |
|---|---|
| Format: | Artigo |
| Jezik: | Inglês |
| Izdano: |
MDPI AG
2022-04-01
|
| Serija: | Electronics |
| Teme: | |
| Online dostop: | https://www.mdpi.com/2079-9292/11/9/1420 |
| Oznake: |
Označite
Brez oznak, prvi označite!
|