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Bias Temperature Instability of MOSFETs: Physical Processes, Models, and Prediction
CMOS technology dominates the semiconductor industry, and the reliability of MOSFETs is a key issue. To optimize chip design, trade-offs between reliability, speed, power consumption, and cost must be carried out. This requires modeling and prediction of device instability, and a major source of ins...
שמור ב:
| Main Authors: | , , , , , |
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| פורמט: | Artigo |
| שפה: | Inglês |
| יצא לאור: |
MDPI AG
2022-04-01
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| סדרה: | Electronics |
| נושאים: | |
| גישה מקוונת: | https://www.mdpi.com/2079-9292/11/9/1420 |
| תגים: |
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