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Bias Temperature Instability of MOSFETs: Physical Processes, Models, and Prediction
CMOS technology dominates the semiconductor industry, and the reliability of MOSFETs is a key issue. To optimize chip design, trade-offs between reliability, speed, power consumption, and cost must be carried out. This requires modeling and prediction of device instability, and a major source of ins...
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| 主要な著者: | , , , , , |
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| フォーマット: | Artigo |
| 言語: | Inglês |
| 出版事項: |
MDPI AG
2022-04-01
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| シリーズ: | Electronics |
| 主題: | |
| オンライン･アクセス: | https://www.mdpi.com/2079-9292/11/9/1420 |
| タグ: |
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