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Bias Temperature Instability of MOSFETs: Physical Processes, Models, and Prediction
CMOS technology dominates the semiconductor industry, and the reliability of MOSFETs is a key issue. To optimize chip design, trade-offs between reliability, speed, power consumption, and cost must be carried out. This requires modeling and prediction of device instability, and a major source of ins...
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| Autori principali: | , , , , , |
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| Natura: | Artigo |
| Lingua: | Inglês |
| Pubblicazione: |
MDPI AG
2022-04-01
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| Serie: | Electronics |
| Soggetti: | |
| Accesso online: | https://www.mdpi.com/2079-9292/11/9/1420 |
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