लोड हो रहा है...
Dependence of resistivity of electrodeposited Ni single layer and Ni/Cu multilayer thin films on the film thickness, and electron mean free path measurements of these films
The Boltzmann equation is a semiclassical approach to the calculation of the electrical conductivity. In this work we will first introduce a simple model for calculation of thin film resistivity and show that in an appropriate condition the resistivity of thin films depends on the electron mean free...
में बचाया:
| मुख्य लेखक: | |
|---|---|
| स्वरूप: | Artigo |
| भाषा: | Inglês |
| प्रकाशित: |
Isfahan University of Technology
2007-09-01
|
| श्रृंखला: | Iranian Journal of Physics Research |
| विषय: | |
| ऑनलाइन पहुंच: | http://ijpr.iut.ac.ir/browse.php?a_code=A-10-1-110&slc_lang=en&sid=1 |
| टैग : |
टैग जोड़ें
कोई टैग नहीं, इस रिकॉर्ड को टैग करने वाले पहले व्यक्ति बनें!
|