लोड हो रहा है...
Simultaneous imaging of the ferromagnetic and ferroelectric structure in multiferroic heterostructures
By measuring the spin polarization of secondary electrons and the intensity of backscattered electrons generated in a scanning electron microscope, we are able to simultaneously image the ferromagnetic domain structure of a ferromagnetic thin film and the ferroelectric domain structure of the underl...
में बचाया:
मुख्य लेखकों: | , , , , , , , |
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स्वरूप: | Artigo |
भाषा: | Inglês |
प्रकाशित: |
AIP Publishing LLC
2014-07-01
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श्रृंखला: | APL Materials |
ऑनलाइन पहुंच: | http://dx.doi.org/10.1063/1.4890055 |
टैग : |
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