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Stability of spin XOR gate operation in silicon based lateral spin device with large variations in spin transport parameters

We investigate stability of the spin exclusive or (XOR) gate operation in silicon(Si) -based lateral spin devices whose spin transport properties have large variations. The optimum charge current, I0, for the spin XOR gate operation is calculated by using the one dimensional spin-drift-diffusion mod...

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Detalhes bibliográficos
Main Authors: Ryoma Ishihara, Soobeom Lee, Yuichiro Ando, Ryo Ohshima, Minori Goto, Shinji Miwa, Yoshishige Suzuki, Hayato Koike, Masashi Shiraishi
Formato: Artigo
Idioma:Inglês
Publicado em: AIP Publishing LLC 2019-12-01
Colecção:AIP Advances
Acesso em linha:http://dx.doi.org/10.1063/1.5129980
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