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Optical Element Surface Defect Size Recognition Based on Decision Regression Tree
Defect size recognition is significant to the evaluation of optical element surface quality. Currently, it’s mainly achieved by the conventional image process, such as threshold segmentation. However, as the defect size gradually approaches the diffraction limit of the imaging system, the defect gra...
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| Main Authors: | , , , |
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| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado em: |
MDPI AG
2020-09-01
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| Colecção: | Applied Sciences |
| Assuntos: | |
| Acesso em linha: | https://www.mdpi.com/2076-3417/10/18/6536 |
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