Study of the Effect of Thin Layer Thickness on the Structural Properties of Copper Phthalocyanine (CuPc) Films Prepared by Vacuum Thermal Evaporation Method

The structural properties of thin films prepared with different thicknesses before and after the annealing process and at different temperatures were studied. X-ray diffraction (XRD), atomic force microscopy (AFM), and emission scanning electron microscopy (FESEM) were used to study the structural...

Descripció completa

Dades bibliogràfiques

Autors principals:	Laith S. alhiti, Rafal A. Jawad, Rafaa A. Abd Alwaahed, Hala M. Sobhi
Format:	Artigo
Idioma:	Inglês
Publicat:	Al-Kitab University 2024-04-01
Col·lecció:	Al-Kitab Journal for Pure Sciences
Matèries:	CuPc thin films vacuum thermal evaporation technique (PVD) atomic force microscope (AFM) thickness root mean square (R.M.S.) structural characteristics
Accés en línia:	https://isnra.net/index.php/kjps/article/view/1138
Etiquetes:	Afegir etiqueta Sense etiquetes, Sigues el primer a etiquetar aquest registre!