Study of the Effect of Thin Layer Thickness on the Structural Properties of Copper Phthalocyanine (CuPc) Films Prepared by Vacuum Thermal Evaporation Method

The structural properties of thin films prepared with different thicknesses before and after the annealing process and at different temperatures were studied. X-ray diffraction (XRD), atomic force microscopy (AFM), and emission scanning electron microscopy (FESEM) were used to study the structural...

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Detalhes bibliográficos

Principais autores:	Laith S. alhiti, Rafal A. Jawad, Rafaa A. Abd Alwaahed, Hala M. Sobhi
Formato:	Artigo
Idioma:	Inglês
Publicado em:	Al-Kitab University 2024-04-01
coleção:	Al-Kitab Journal for Pure Sciences
Assuntos:	CuPc thin films vacuum thermal evaporation technique (PVD) atomic force microscope (AFM) thickness root mean square (R.M.S.) structural characteristics
Acesso em linha:	https://isnra.net/index.php/kjps/article/view/1138
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