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Reliability Assessment of Light-Emitting Diode Packages With Both Luminous Flux Response Surface Model and Spectral Power Distribution Method

The inherent luminous characteristics and stability of LED packages during the operation period are highly dependent on their junction temperatures and driving currents. In this paper, the luminous flux of LED packages operated under a wide range of driving currents and junction temperatures are inv...

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Principais autores: Wei Chen, Jiajie Fan, Cheng Qian, Bin Pu, Xuejun Fan, Guoqi Zhang
Formato: Artigo
Idioma:Inglês
Publicado em: IEEE 2019-01-01
Colecção:IEEE Access
Assuntos:
Acesso em linha:https://ieeexplore.ieee.org/document/8715353/
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