Reliability Assessment of Light-Emitting Diode Packages With Both Luminous Flux Response Surface Model and Spectral Power Distribution Method

The inherent luminous characteristics and stability of LED packages during the operation period are highly dependent on their junction temperatures and driving currents. In this paper, the luminous flux of LED packages operated under a wide range of driving currents and junction temperatures are inv...

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Autori principali:	Wei Chen, Jiajie Fan, Cheng Qian, Bin Pu, Xuejun Fan, Guoqi Zhang
Natura:	Artigo
Lingua:	Inglês
Pubblicazione:	IEEE 2019-01-01
Serie:	IEEE Access
Soggetti:	Light-emitting diode luminous flux response surface model spectral power distribution luminous efficacy decay degradation mechanism
Accesso online:	https://ieeexplore.ieee.org/document/8715353/
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