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A Write-Buffer Scheme to Protect Cache Memories Against Multiple-Bit Errors

Protecting cache memories against radiation-induced soft errors is critical in designing highly reliable processors. Dirty lines in write-back data caches are more critical, since the dirty lines have no backups in lower-level memory (LLM). This paper provides a write-buffer scheme for backing up di...

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Hoofdauteurs: Jie Li, Liyi Xiao, Linzhe Li, Hongchen Li, He Liu, Chenxu Wang
Formaat: Artigo
Taal:Inglês
Gepubliceerd in: IEEE 2022-01-01
Reeks:IEEE Access
Onderwerpen:
Soft error
reliability
parity check
write-buffer
cache
Online toegang:https://ieeexplore.ieee.org/document/9857910/
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