Double Adjacent Error Correction Codes for Ultra-Fast Cache Memories

Error correction codes are commonly used to protect cache memories from soft errors. As technology feature size scales deeper into sub-nanometer regime, radiation-induced soft error can causes double adjacent error (DAE). Several double adjacent error correction (DAEC) codes have been introduced to...

全面介紹

書目詳細資料

Principais autores:	Rabah Abood Ahmed, Khairulmizam Samsudin
格式:	Artigo
語言:	Inglês
出版:	IEEE 2025-01-01
叢編:	IEEE Access
主題:	Error correction codes Orthogonal Latin square codes parity check bits SEC-DED-DAEC SEC-DAEC cache memory
在線閱讀:	https://ieeexplore.ieee.org/document/10813377/
標簽:	添加標簽 沒有標簽, 成為第一個標記此記錄!